Ieee Design & Test

Journal Title：Ieee Design & Test

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《IEEE 设计与测试》提供原创作品，介绍用于设计和测试微电子系统（从设备和电路到完整的片上系统和嵌入式软件）的模型、方法和工具。该杂志侧重于当前和近期的实践，包括教程、操作方法文章和真实案例研究。该杂志力求通过专栏、访谈和圆桌讨论，向读者介绍重要的技术进步以及技术领导者的观点。主题包括半导体 IC 设计、半导体知识产权模块、设计、验证和测试技术、制造和产量设计、嵌入式软件和系统、低功耗和节能设计、电子设计自动化工具、实用技术和标准。

Ieee Design & Test创刊于2013年，由IEEE Computer Society出版商出版，收稿方向涵盖COMPUTER SCIENCE, HARDWARE & ARCHITECTURE - ENGINEERING, ELECTRICAL & ELECTRONIC全领域，此期刊水平偏中等偏靠后，在所属细分领域中专业影响力一般，过审相对较易，如果您文章质量佳，选择此期刊，发表机率较高。平均审稿速度 ，影响因子指数1.9，该期刊近期没有被列入国际期刊预警名单，广大学者值得一试。