Journal Of Electronic Testing-theory And Applications

Journal Title：Journal Of Electronic Testing-theory And Applications

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

Testing of VLSI devices printed circuit boards, and electronic systems;

Testing of analog and digital electronic circuits;

Testing of microprocessors, memories, and signal processing devices;

Fault modeling;

Test generation;

Fault simulation;

Testability analysis;

Design for testability;

Synthesis for testability;

Built-in self-test;

Test specification;

Fault tolerance;

Formal verification of hardware;

Simulation for verification;

Design debugging;

AI methods and expert systems for test and diagnosis;

Automatic test equipment (ATE);

Test fixtures;

Electron Beam Test Systems;

Test programming;

Test data analysis;

Economics of testing;

Quality and reliability;

CAD Tools;

Testing of wafer-scale integration devices;

Testing of reliable systems;

Manufacturing yield and design for yield improvement;

Failure mode analysis and process improvement

《电子测试：理论与应用杂志》是传播电子测试领域研究和应用信息的国际论坛。这是唯一一本专门针对电子测试的杂志。《电子测试：理论与应用杂志》上发表的论文经过同行评审，以确保原创性、及时性和相关性。该杂志提供档案材料，并通过其快速的出版周期，努力将最新成果带给研究人员和从业人员。虽然它强调发表珍贵的未发表材料，但需要更广泛曝光的优秀会议论文，只要符合该杂志的同行评审标准，编辑也会酌情发表。 《电子测试：理论与应用杂志》还寻求清晰的调查和评论文章，以促进对最新技术的更好理解。

《电子测试：理论与应用杂志》的报道包括但不限于以下主题：

VLSI 设备印刷电路板和电子系统的测试；

模拟和数字电子电路的测试；

微处理器、存储器和信号处理设备的测试；

故障建模；

测试生成；

故障模拟；

可测试性分析；

可测试性设计；

可测试性综合；

内置自测试；

测试规范；

容错；

形式验证硬件；

验证模拟；

设计调试；

测试和诊断的人工智能方法和专家系统；

自动测试设备（ATE）；

测试夹具；

电子束测试系统；

测试编程；

测试数据分析；

测试经济性；

质量和可靠性；

CAD 工具；

晶圆级集成器件测试；

可靠系统测试；

制造良率和良率改进设计；

故障模式分析和工艺改进

Journal Of Electronic Testing-theory And Applications创刊于1990年，由Springer US出版商出版，收稿方向涵盖工程：电子与电气 - 工程技术全领域，此期刊水平偏中等偏靠后，在所属细分领域中专业影响力一般，过审相对较易，如果您文章质量佳，选择此期刊，发表机率较高。平均审稿速度 较慢,6-12周 ，影响因子指数1.1，该期刊近期没有被列入国际期刊预警名单，广大学者值得一试。