Microelectronics Journal

Journal Title：Microelectronics Journal

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.

The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

《微电子学杂志》自 1969 年创刊以来，是一个传播微电子系统、电路和新兴技术研究和应用的国际论坛。《微电子学杂志》上发表的论文都经过同行评审，以确保其原创性、相关性和时效性。因此，该杂志提供了有关微电子电路和系统的全球定期全面更新。

《微电子学杂志》诚邀撰写描述以下所有领域重要研究和应用的论文。涵盖最新发展的综合评论/调查论文也将予以考虑。《微电子学杂志》涵盖电路和系统。该主题包括但不限于：模拟、数字、混合和射频电路及相关设计方法；逻辑、架构和系统级综合；测试、可测试性设计、内置自测试；面积、功率和热分析与设计；混合域仿真与设计；嵌入式系统；非冯诺依曼计算及相关技术和电路；高复杂度系统集成的设计和测试； SoC、NoC、SIP 和 NIP 设计和测试；3-D 集成设计和分析；新兴器件技术和电路，如 FinFET、SET、自旋电子学、SFQ、MTJ 等。

也欢迎应用方面，例如信号和图像处理（包括密码电路）、传感器和执行器（包括传感器网络）、可靠性和质量问题以及经济模型。

Microelectronics Journal创刊于1967年，由Elsevier出版商出版，收稿方向涵盖工程技术 - 工程：电子与电气全领域，此刊是中等级别的SCI期刊，所以过审相对来讲不是特别难，但是该刊专业认可度不错，仍然是一本值得选择的SCI期刊 。平均审稿速度 约3.0个月 ，影响因子指数1.9，该期刊近期没有被列入国际期刊预警名单，广大学者值得一试。